| Instrument
|
Description |
| Abbe
Refractometer |
used
in conjunction with various laser and other light sources to
measure refractive index, change in refractive index with temperature,
or birefringence of glasses, liquids, liquid crystals, and polymers |
| HP
1100 high performance liquid chromatograph (HPLC) |
equipped
w/ diode array and refractive index detectors for determining
purity in low molar mass compounds |
| HP
5890A Series II/5988A gas chromatograph/mass spectrometer (GC-MS)
|
w/
auxiliary direct insertion probe for determining molecular structure,
purity, in low molar mass compounds |
| Waters
GCT Premier gas chromatograph-time of flight mass spectrometer |
w/
auxiliary direct insertion probe for determining molecular structure,
purity, in low molar mass compounds;
accurate mass measurements (0.01 Daltons) |
| Bruker
IFS-66 Fourier Transform spectrometer w/ Hyperion 2000 IR microscope |
acquires
high-resolution transmission and reflection spectra ranging
from the UV region (200 nm) to the far IR region (50 cm-1).
The optical bench is equipped for both step-scan and rapid-scan
data collection, and can acquire time-resolved spectra in the
nanosecond regime. Interfaced to the IFS-66 optical bench is
a Hyperion 2000 IR microscope, which allows both visible observation
of samples and collection of IR spectra on the viewed sample
area. The computer-controlled microscope stage allows raster-scanning
of larger samples to produce IR spectral profile maps of the
entire sample area. |
| Varian
Mercury 200 MHz Fourier transform nuclear magnetic resonance
(NMR) spectrometer |
w/
H1, F19, C13, and P31
and variable temperature capability; for determining molecular
structure |
| Perkin-Elmer
DSC-7 w/ CCA-7 liquid N2 controlled cooling accessory |
for
measuring glass transition, liquid crystal phase transitions,
melting points of solids and low molar mass compounds |
| Mettler
FP52 hot stage |
optical
spectroscopy and experiments at elevated temperatures |
| Solartron
1260 Impedance/Gain/Phase Analyzer w/1296 2A (4A) sample holder
for solids (liquids) |
dlelectric
spectroscopy; measurement of impedance (1 ohm to 100Terra ohms)
for calculating resistance, capacitance, conductance and dielectric
constants of solids and liquids over a frequency range of from
10 µHz to 32 MHz |
| Leica
DMRX polarizing microscope w/ DC300F digital camera |
optiical
microscopy of materials |
| Leitz
Orthoplan Pol polarizing microscope interfaced to a Mettler
FP-800HT hot stage |
conoscopy;
w/ low temperature cooling accessory for studies of material
phases in polarized light |
| Leitz
Metalloplan microscope w/ Nomarski |
characterization
of materials |
| Perkin-Elmer
Lambda 900 UV-VIS-NIR spectrophotometer |
spectral
characterization on small samples and large devices from 200-3200
nm |
| HP
8453E diode array spectrometer |
spectral
characterization from 200-1100 nm |
The
following additional equipment is located
in a lab shared with Prof. S. H. Chen.
|
| Agilent
1100/Viscotek Size exclusion chromatograph w/ diode array, refractive
index, viscosity, and light scattering detectors |
molecular
weight distribution in polymers |
| PTI
Spectrofluorimeter |
measures
fluorescence for solids, liquids, and devices |
| Instrument
|
Description |
| OptiPro
Systems SX50 and 150 Spherical Generating Machines |
Deterministic
CNC generating of rotationally symmetric, spherical and flat
surfaces to a precision of l/2 and
a rms surface roughness of 0.2 µm on brittle materials;
performs edging and beveling in one machine set-up |
| Moore
Nanotechnology Systems Nanotech® 500FG Freeform Generator |
Conformal
deterministic generator for non-rotationally symmetric parts |
| QED
Technologies Q22-Y MRF machine |
Magnetorhological
finishing machine for studying the polishing of glasses and
crystals - rotational and raster scanning capability |
| Arizona
Instruments Computrac MAX1000 moisture analyzer |
Measures
water content of aqueous slurries |
| Colloidal
Dynamics Acoustosizer IIs |
Measures
particle size distributions from 0.01µm to 10µm
for concentrated suspensions; also measures zeta potential (particle
charge) as a function of pH |
Anne Marino (right- BA Math U of R '05, MS Industrial
Math RIT '07) and Jessica DeGroote (left-BS Optics '02,
MS Optics '04, PhD Optics '07) using the Acoustosizer II
for particle size analysis.
|
| Brookfield
DVIII Programmable Rheometer |
Measures
viscosity of fluid as a function of shear rate |
| Taylor
Hobson Series 2 Form Talysurf PGI System |
Contact
profilometer for precision form measurement to 16 nm resolution
on parts up to 120 mm in diameter and with sag up to 28 mm |
| Zygo
GPI xp phase measuring interferometer |
Global
surface shape of 100 mm dia. smooth flats or spherical surfaces
to nm precision |
| Taylor
Hobson Talysurf CCI 3000 non-contact 3D surface profiler (new
9/04) |
microroughness
and step height measurement with 0.01nm vertical resolution
and 0.36 nm lateral resolution |
| Zygo
New View 5000 3D imaging surface structure analyzer |
Microroughness
from 100 µm down to 3 Å over 0.25 x 0.35 mm area
with 1 µm lateral resolution |
| Starrett
PREMIS HGDC 2018-16 direct computer controlled coordinate measuring
machine (CMM) |
Arbitrary
surface shapes in a 300 mm x 300 mm x 200 mm envelope to a precision
of ~3 µm in three dimensions over the full volume |
| Digital
Instruments Nanoscope III Atomic Force Microscope (AFM) |
Surface
topography maps with atomic scale lateral resolution; equipped
to perform contact AFM, tapping mode AFM, non-contact AFM, lateral
force microscopy (LFM), phase imaging, and nanoindentation at
very low loads (Hystron Triboscope) |
| NanoInstruments
Nano -indenter II, version 2.2 |
Hardness
and near surface properties of solids at low loads ~1 mN |
| Tukon
Microhardness Tester |
Moderate
(1g load) hardness and fracture toughness |
| Witec
Alpha Scanning Near-field Optical Microscope (SNOM) |
High
resolution surface feature studies using scanning near-field
optical microscopy, confocal microscopy, and atomic force microscopy
in a single instrument |
| Exicor®
(Birefringence measurement system)
Hinds
International |
System
for measuring stress in materials; high sensitivity maps of
optical retardance for transparent, flat parts up to 100 x 100mm
diameter |
Leica
Optical Microscope
Model: DC 300F |
Bright
field/Dark field with Nomarski; objectives 1.5x to 50x; equipped
with digital camera and color monitor; electronic transfer of
images |
